Observation of coherent hybrid reflection with synchrotron radiation

High resolution synchrotron radiation has been used to investigate the occurrence of coherent hybrid reflections (CHR) in the In0.49Ga0.51P/GaAs(001) structure. Several phi scans at the 002 layer reflection were carried out. The scanned phi intervals are correlated by the axis symmetry and [001] should present the same pattern. A break in the symmetry is observed due to constructive/destructive interference of the hybrid amplitudes with the amplitude from the 002 layer reflection. The effects of substrate miscut and interface distance are taken into account to explain the observed patterns. The application of CHR as a high sensitive tool to analyze epitaxial growth is discussed. (C) 1998 American Institute of Physics. [S0003-6951(98)03841-8].73152194219

Piezoelectric coefficients of mNA organic nonlinear optical material using synchrotron X-ray multiple diffraction

Distortions produced in the unit cell of a nonlinear organic crystal under the influence of an applied electric field E are investigated by using synchrotron x-ray multiple diffraction (MD). A typical MD pattern shows numerous (hkl) secondary peaks and the position of each one is basically a function of the unit cell lattice parameters. Thus small changes in any parameter due to a strain produced by E give rise to a corresponding variation in the (hkl) peak position. The method was applied to the meta-nitroaniline (mNA) crystal and we were able to determine three piezoelectric coefficients. [S0031-9007(98)07912-5].81245426542

Piezoelectric coefficients d(14), d(16), d(34) and d(36) of an L-arginine hydrochloride monohydrate crystal by X-ray three-beam diffraction

Previous work employed X-ray three-beam diffraction techniques to obtain part of the L-arginine hydrochloride monohydrate (L-AHCL. H2O) piezoelectric coefficients, namely d(21), d(22), d(23) and d(25). Those coefficients were obtained by measuring the shift in the angular position of a number of secondary reflections as a function of the electric field applied in the [ 010] piezoelectric direction. In this paper a similar procedure has been used to measure the remaining four piezoelectric coefficients in L-AHCL. H2O: with the electric field applied in the [100] direction, d(14) and d(16) were measured; with the electric field applied in the [001] direction, d(34) and d(36) were obtained. Therefore the entire piezoelectric matrix of the L-AHCL. H2O crystal has been successfully measured.13643543

Synchrotron-radiation x-ray multiple diffraction applied to the study of electric-field-induced strain in an organic nonlinear optical material

In this work, distortions produced in the unit cell of a MBANP [(-)-2-(alpha-methylbenzylamino)-5-nitropyridine] nonlinear organic crystal under the influence of an applied electric field, (E) over bar, are investigated by using synchrotron-radiation x-ray multiple diffraction (XRMD). The method is based in the inherent sensitivity of this technique to determine small changes in the crystal lattice, which provide peak position changes in the XRMD pattern (Renninger scan). A typical Renninger scan shows numerous secondary peaks, each one carrying information on one particular direction within the crystal. The (hkl) peak position in the pattern, for a fixed wavelength, is basically a function of the unit cell lattice parameters. Thus small changes in any parameter due to a strain produced by (E) over right arrow give rise to a corresponding variation in the (hkl) peak position and the observed strain is related to the piezoelectric coefficients. The advantage of this method is the possibility of determining more than one piezoelectric coefficient from a single Renninger scan measurement [L. H. Avanci, L. P. Cardoso, S. E. Girdwood, D. Pugh, J. N. Sherwood, and K. J. Roberts, Phys. Rev. Lett. 81, 5426 (1998)]. The method has been applied to the MBANP (monoclinic, point group 2) crystal and we were able to determine four piezoelectric coefficients: \d(21)\ = 0.2(1) X 10(-11) CN-1, \d(22)\ = 24.8(3) X 10(-11) CN-1, \d(23)\ = 1.3(1) x 10(-11) CN-1, and \d(25)\ = 5.9(1) X 10(-11) CN-1. The measurements were carried out using the SRS stations 16.3, Daresbury Laboratory, Warrington, UK.61106507651

Hysteresislike behavior in meta-nitroaniline crystals

In this paper we report, for the first time, an experimentally observed hysteresislike variation of lattice parameter of the organic crystal 2-nitro aniline (mNA) under the influence of an externally applied de electric field. Calculations have been made to determine whether the main features of the hysteresislike behavior can be explained in terms of the geometrical distortions of isolated mNA molecules or are dominated by molecular interactions. The results show that the main features of the nonlinearity can be explained in terms of changes in the acceptor-donor properties of isolated mNA molecules.83245146514

Habit modification of nearly perfect single crystals of potassium dihydrogen phosphate (KDP) by trivalent manganese ions studied using synchrotron radiation X-ray multiple diffraction in Renninger scanning mode

The X-ray multiple diffraction technique using synchrotron radiation is applied in the preliminary study of the habit modification of KDP samples as induced by incorporation of the trivalent transition metal cation Mn3+. High-resolution Renninger scans of pure and doped KDP were carried out using 400 as the primary reflection, echoing the fact that these impurity species were segregated in the {100} growth sector. The analysis of the Renninger scans of the doped KDP crystals is consistent with the presence of the impurity species chemically bound within the KDP crystal structure, as confirmed through the suppression of the huge observed peak asymmetry, characteristic of perfect crystals. In addition, an extra Renninger-scan peak measured for the doped material is indicative of the impurity atoms occupying interstitial crystallographic sites in the lattice, a result consistent with X-ray standing-wave measurements. Renninger-scan reflection curve widths and lattice parameter measurements reveal the decrease in crystalline perfection ( increased mosaic spread, eta) and lattice contraction of ca 0.4% in the a and c lattice directions at the surface plane for the Mn3+-doped KDP samples in comparison with the undoped crystals.3651230123

Sensitivity of Bragg surface diffraction to analyze ion-implanted semiconductors

A special case of the x-ray multiple diffraction phenomenon, the Bra,og surface diffraction (BSD), has been investigated under lattice damage due to ion implantation in GaAs (001) samples. The BSD profile is very sensitive to the diffraction regime (dynamical or kinematical) and provides information regarding crystalline perfection and lattice strains in both directions-parallel and perpendicular-to the sample surface. Results from grazing-incidence x-ray diffraction and are also reported. (C) 1997 American Institute of Physics.71182614261

High-resolution synchrotron radiation Renninger scan to examine hybrid reflections in InGaP/GaAs(001)

High-resolution synchrotron radiation Renninger scans (RS) have been used in the analysis of hybrid reflections in the InGaP/GaAs structure. Four-beam cases involving two Bragg (primary and secondary) and one Laue (secondary) reflections of the 002 Renninger scans for the GaAs substrate and the InGaP layer were analysed in detail. Different structures of asymmetry regarding the inplane directions [110] and [1] were observed from the measurements of the same three families of four-beam cases, {1} /{1 1}3, {20}0/{20}2 and {3 } /{3 }3, at phi several positions. The comparison between the experimental and MULTX simulated scan clearly shows a marked asymmetry observed on the {20}0/{20}2 contributions. An asymmetric peak instead of the simulated dip appears due to the layer Laue secondary beam {20}0 crossing the layer/substrate interface to generate a hybrid peak. The break in the lattice coherence for this heterostructure is shown by the occurrence of an unexpected dip in the layer RS, which does not obey the mirror symmetry.61293